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Listers,

Here is the November 2007 Microscopy Today table of contents. I will 
close the subscription list for this issue on Thursday November 1st, 2007.

Microscopists in North America and MSA members anywhere qualify for free 
subscriptions. Anyone else may subscribe for US$50 per year (to 
PARTIALLY cover postage). All subscriptions at 
http://www.microscopy-today.com . Subscription rate for non-qualified 
readers will go to US$60 in 2008.

Thank you.

Ron Anderson, Editor
========================
Establishing the Initial Embryonic Axis
Stephen W. Carmichael and Gary C. Schoenwolf1, Mayo Clinic and the 
1University of Utah

Beyond Death: Forensic Investigations of pre-Columbian Mummies from the 
Tarapacá Valley, Chile, Using Variable Pressure SEM and Raman Spectroscopy
S.V. Prikhodko, C. Fischer, R. Boytner, M. C. Lozada, M. Uribe, I. 
Kakoulli, UCLA, U. of Chicago, and U. de Chile

Applications of the Helium Ion Microscope
Larry Scipioni, Lewis Stern, and John Notte, ALIS Business Unit, Carl 
Zeiss SMT, Inc., Peabody, MA

Methods of Maximizing X-ray Detection in SEMs
David Rohde, Patrick Camus, Thermo Fisher Scientific, Madison, WI

Three Dimensional Imaging of Structure and Flow—Critical to Advances in 
Microfluidics
Carlos Hidrovo1, and Terence Lundy2, 1Stanford University 2Hyphenated 
Systems, Burlingame, CA

Is a Cs Corrector Necessary for Lorentz Vector Field Tomography?
Charudatta Phatak, Marc De Graef, Carnegie Mellon University, Pittsburgh, PA

TEM of Bacteriophages Found in Marine Sources
A. Fejeran1, J. Polanco2, G. Lander3, T. Ajero Jr3, B. Carragher3, C. S. 
Potter,3 1Mount Miguel High School, Spring Valley, CA, 2Hilltop High 
School, Chula Vista, CA, 3Scripps Research Institute, La Jolla, CA

Nanoscale Thermal Property Characterization of Automotive Polymer Coatings
Louis T. Germinario, Eastman Chemical Company, Kingsport, TN

Computer-Controlled Polishing System For Preparing Multiple Pre-FIB TEM 
Specimens
D. J. MacMahon1 and E. Raz-Moyal2, Micron Technology, Inc. and 2Gatan, 
Inc., Manassas, VA and Pleasanton, CA

Tungsten Filament Heating Effects
Paul Beauregard, Microscopist, Greensburg, TN

The Database Solution to Particle-by-Particle Analysis of Mixed Mineral 
Dusts
B.R. Strohmeier, K.L. Bunker, K.E. Harris, R. Hoch, and R.J. Lee, RJ Lee 
Group, Inc., Monroeville, PA

Table Top SEM Utilization in a High School Nanotechnology Course
Leonard, D.N., Appalachian State University, Boone, NC

Microscopy for Children
Caroline Schooley, Project MICRO Coordinator, MSA

Industry News

NetNotes
SAMPLE PREPARATION – staining lipids for TEM
SAMPLE PREPARATION - staining polysaccharides for TEM
SAMPLE PREPARATION – Thermanox coverslip
SAMPLE PREPARATION - dewaxing leaf surface for SEM
SAMPLE PREPARATION - osmium tetroxide on Lowicryl sections
SAMPLE PREPARATION – premature polymerization
SAMPLE PREPARATION - Au on C and Al/W dendrites
SAMPLE PREPARATION – sputter coater glass chamber
SAMPLE PREPARATION - sputter coater thickness
EM - Wi-Fi and RF interference
TEM – contamination
SEM - tilt correction
SEM - wt% or atom%?
SEM - secondary electron detection
EDX - SDD detectors
ELECTRON DIFFRACTION
XRF in SEM-ED
GENERAL TECHNIQUES - canned air

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