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Date: | Mon, 1 Dec 2008 16:39:53 +0100 |
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> From: Confocal Microscopy List [mailto:[log in to unmask]] On
> Behalf Of Lutz Schaefer
> Sent: Saturday, November 29, 2008 5:55 PM
> To: [log in to unmask]
> Subject: Re: Deconvolution Algorithms Continued
>
> a confocal PSF (or generally, any incoherent PSF of an aplanatic microscope
> system) is the product of the excitation and emission distributions. The
> exitation PSF could be approximated by a widefield PSF and the emission PSF
> by a widefield PSF (using the emission wavelength) but convolved by the
> pinhole geometry. You need to be careful with sampling and scaling issues.
> Other than that its not a big deal. The approximation with widefield vs
> point-scanner had been okay in nearly all cases that came across my work.
> For the calculation of widefield PSF's I suggest the classic Sarah Gibson
> and Frad Lanni's paper "Experimental test of an analytical model of
> aberration in an oil immersion objective lens used in three dimensional
> light microscopy" JOSA V.9 N.1 1992 (which was to the best of my knowledge
> also implemented in XCOSM). But of course, you may also use the slightly
> more accurate vector wave model.
When I searched Google on "Geert Van Kempen", the first hit is a link to his
PhD: http://www.ns.tudelft.nl/live/pagina.jsp?id=d45bad79-71f7-4358-98d2-6bd78f432b3a&lang=en
In there, some explanation about image formation is given for both
widefield and
confocal microscopy (I used it as the main reference for a section in
my own thesis).
Kind regards,
Filip Rooms
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