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Listers,

Here is the July 2007 Microscopy Today table of contents. I will close 
the subscription list for this issue on Wednesday, July 6th, 2007.

Microscopists in North America and MSA members anywhere can subscribe 
for free. Anyone else may subscribe for US$50 per year (to PARTIALLY 
cover postage). All subscriptions at http://www.microscopy-today.com 
Thank you.

Ron Anderson, Editor
================================
Probing Individual Proteins in Unsupported Membranes
Stephen W. Carmichael, Mayo Clinic, Rochester, MN

Microbeam Analyses of the Most Challenging Extraterrestrial Samples Ever 
Returned
Frans J.M. Rietmeijer, U. of New Mexico, Albuquerque, NM

Microscopy Today 2007 Salary Survey Results
Ron Anderson and Barbara Foster,* Microscopy Today and 
*Microscopy/Microscopy &Education, Inc.

Fibrous Sepiolite Use As An Asbestos Substitute: Analytical Basics
Louis Solebello, Int'l Asbestos Testing Lab. Inc., Mt. Laurel, NJ

Low Vacuum SEMs: Latest Generation Technologies and Applications
William Neijssen, Ben Lich, & Pete Carleson* FEI Company, Eindhoven, The 
Netherlands and *Hillsboro, OR, USA

Luminance Contrast – a New Visible Light Technique for Examining 
Transparent Specimens
Jörg Piper, Clinic Meduna, Bad Bertich, Germany

Temporal Evolution of Incipient Damage on Metallic Surfaces Analyzed by 
Unidirectional Laser Oblique Illumination (ULOI)
E.A. Favret1,2, N.O. Fuentes2,3, & L. Ferrero2,1; Inst. de Tecnología 
Agropecuaria (INTA), 2Univ. Nacional de Gral San Martin, 3Comisión 
Nacional de Energía Atómica, Buenos Aires. Argentina

Multimode Trans-Illuminator for the Stereomicroscope
Ted Clarke, Retired Materials Engineer

New Approaches to Managing, Marketing, and Money for Maintaining a Core 
Facility
Developing a Financial Plan for the Long-term “Care and Feeding” of 
Major Equipment
Alberto Rodriguez and Charlene Sullivan, Krannert School of Management, 
Purdue University

The College of Microscopy – Meeting Rapidly Growing Microscopy Demands
Donald A. Brooks, The McCrone Group, Westmont, Illinois

Getting Epoxy Semi-Thin Sections to Stick to Glass Slides
Gilbert (Gib) Ahlstrand, Univ. of Minnesota, St. Paul, MN

SEM Stub Holders for Sputter Coating at 90° Tilt
Amanda Best, Central Michigan University, Mt. Pleasant, MI

Digital Cameras and the TEM
Warren Straszheim, Iowa State University, Ames, Iowa

Silicon Cross-Section Sample Preparation (Cleaving)
Richard Beanland, Materials Analysis, Bookham, U.K.

Industry News

NetNotes
SPECIMEN PREPARATION - cell cultures and aldehyde fixatives
SPECIMEN PREPARATION - lung tissue
SPECIMEN PREPARATION – enhancing contrast of mitochondria
SPECIMEN PREPARATION - plant fixation
SPECIMEN PREPARATION - cacodylate vs. phosphate buffer
SPECIMEN PREPARATION - myelin osmication
SPECIMEN PREPARATION - alternative to uranyl acetate stain
SPECIMEN PREPARATION - lead citrate and block staining
SPECIMEN PREPARATION - dehydration of molds
SPECIMEN PREPARATION – ruthenium oxide
SPECIMEN PREPARATION - bacterial flagella
SPECIMEN PREPARATION - bacterial samples for SEM
SPECIMEN PREPARATION - cationic dyes for bacterial visualization in SEM
SPECIMEN PREPARATION - progressive lowering of temperature technique
SPECIMEN PREPARATION - metal shadow casting of DNA
SPECIMEN PREPARATION – cross-sectioning packaging film
SPECIMEN PREPARATION - aluminum evaporation
SPECIMEN PREPARATION – sputter coating
SPECIMEN PREPARATION – humidity levels
IMAGING – digital compression
XTEM - surface densities of particles
SEM - smooth, low-Z substrates
SEM - imageing on glass
SEM - aluminosilicate and BSE
SEM - intermittent vacuum leak
STEM-EDX
EDS - carbon contamination
ELECTRON DIFFRACTION - instability
ELECTRON DIFFRACTION - orientation of the diffraction pattern

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