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Electron Microprobe Lab, University of Minnesota
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Please consider attending our EPMA workshop in September. Only a few
spaces left so don't delay. Details and registration at:
Center for Advanced Materials Characterization in Oregon (CAMCOR) Presents
Problem Solving Using Microanalysis Tools Workshop
Focus on both instrumental methods and software algorithms for
solving real world analytical problems for science and industry in
EPMA in a variety of samples, conditions and geometries. Hands on
workshops and labs to explore new ideas for extending EPMA for all users.
September 16, 17, 18 (Tuesday, Wednesday, Thursday) 2008
University of Oregon, Eugene, Oregon
Preliminary Outline of Program
A three day hands on workshop exploring problems and solutions for
difficult and/or complex analytical situations using the latest
analytical methods, instrumental techniques and software algorithms.
Workshop will be held in the new Integrated Science Complex, Lorry I.
Lokey Laboratory (temperature controlled, low vibration/low EMI
underground Microanalytical Facility).
Cameca SX50 with Bruker SDD
Cameca SX100 with Thermo SDD
FEI Quanta with Thermo SDD and HKL EBSD
Quantitative microanalysis (bulk, particles, thin films)
Quantitative x-ray mapping (WDS and spectrum imaging)
Software modeling: Casino, WinXray, Penelope, and DTSA II
Jeff Davis- "Large (very large) area mapping with millipore XRF"
Mike Jercinovic- "Practical Considerations in trace element analysis by EPMA"
John Fournelle- "Light element quantification, problems and pitfalls"
Dale Newbury- "Desktop Spectrum Analyzer-2 (DTSA-2: Son of DTSA):
Nicholas Ritchie's Answer to the Microanalyst's Need for Spectrum Simulation"
Lab Instrument/Computer Demonstrations and Exercises:
Dale Newbury- "Data mining demonstration using SDD and spectrum
imaging with Lispix"
Dale Newbury- "Auto ID, caveat emptor"
Ed Vicenzi "Methods for Analyzing X-ray Spectrum Images"
Ed Vicenzi, Jeff Davis, and Dale Newbury "Analyzing Multiphase
Regions: Should I Use a Defocused Beam or Phase Imaging?"
Ed Vicenzi and Dale Newbury "Cathodoluminescence Imaging"
Jeff Davis, Ed Vicenzi, Dale Newbury (Quanta) "Analysis of Complex
Cements: Phase ID and Detection Limits"
Paul Carpenter- Quality Control and Your Electron Microprobe:
Ensuring the Data You Produce is Valid
Paul Carpenter- Quantitative EPMA Using Probe for Windows: Setting
Up a Quantitative Analysis Run on the Microprobe
Paul Carpenter/John Donovan- Advanced EPMA: Peak Overlaps, Trace
Element Analysis, Beam-sensitive Materials, Layered Specimens, and Particles
Paul Carpenter, Matrix Corrections and Mass Absorption Coefficients
John Donovan- Quantitative Thin Film Analysis using EPMA, Part I
John Donovan- Quantitative Thin Film Analysis using EPMA, Part II
John Donovan- Pathological Interferences and How to Deal With Them
John Fournelle- EBSD Tutorial
John Fournelle- Modeling secondary Fluorescence with Penelope Monte-Carlo
John Fournelle- Off-peak selection, background modeling and artifacts
Mike Jercinovic- "Spatial Resolution and trace element sensitivity"
Mike Jercinovic- "Selection of experimental parameters for high
Special Presentation by Ellery Frahm
"Scandinavian Reindeer Herding, Tunisian Timekeeping, and Electron
Probe Microanalysis: Considering Technological Choices"
FEI Helios dual beam
Zeiss Ultra 55 (Nabity Lithography)
FEI Titan Analytical TEM
Thermo VG XPS
Bruker, Rigaku and Scintag XRDs
For more information contact:
John Donovan, [log in to unmask], 541-346-4632