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July 2013

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Subject:
From:
John Fournelle <[log in to unmask]>
Reply To:
JEOL-Focused Probe Users List <[log in to unmask]>
Date:
Sat, 6 Jul 2013 16:32:46 -0500
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Thinking about coming to AGU 2013, Dec 9-13, in San Francisco? 

You are invited to submit an abstract  to  this Session:

V027: Microanalysis in Geoscience: Advances and Challenges

Advances in microanalytic technology and instrumentation have given geoscientists new possibilities in examining earth and planetary materials. Low kV electron probe microanalysis with field emission guns, femto-second lasers, more versatile CL detectors, FIB, charge-contrast imaging, high precision Ar/Ar mass spectrometry for geochronology, EBSD, PIXE, and SIMS analysis of minerals, to name some. Challenges exist, e.g. interpreting, quantifying, and evaluating the results. There is an increasing need for development of well characterized reference materials/standards. Sample preparation can be a stumbling block (e.g. EBSD). We particularly invite abstracts which document unresolved problems.

Conveners:
John Fournelle <[log in to unmask]>
Axel Renno <[log in to unmask]>
Michael Jerinovic <[log in to unmask]>

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