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June 2012

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Subject:
From:
John Fournelle <[log in to unmask]>
Reply To:
JEOL-Focused Probe Users List <[log in to unmask]>
Date:
Sat, 16 Jun 2012 10:16:17 -0500
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We would like to invite you to submit an abstract to the V030 Microanalysis session at the AGU Fall Meeting, December 3-7, 2012, San Francisco. Abstract submission is now open and will close August 8.

"Advances in microanalysis instrumentation continue to provide the opportunities to measure smaller volumes and lower detection levels, to apply previously unimaginable computer power, and to visualize our samples in 3 dimensions. One ongoing concern has been the generation of good, appropriate reference materials for the critical standardizations needed in microanalysis. This session welcomes contributions in all areas of microanalytical development and application, e.g. -ICPMS, EPMA (including Field Emission), SIMS, Atom Probe, Ar/Ar, CL, EBSD, X-ray tomography, etc. We welcome abstracts documenting unresolved problems."

John Fournelle, University of Wisconsin
John Hanchar, Memorial University of Newfoundland

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