We are looking to purchase a new FE-EPMA and would like any input good or bad on the systems out there, Cameca and JEOL.
Specially interested in feedback on reliability of detectors, column and any other hardware issues.
Another topic of concerns is the EDS system on the microscopes and how does the Cameca and JEOL systems handle EDS/WDS dual applications.
Any inputs will be greatly appreciated.
Thanks y Muchas Gracias,
Jorge A Ramos
Senior Staff Technician
Materials Characterization Division
ALCOA Technical Center
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