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January 2019

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Subject:
From:
Donggao Zhao <[log in to unmask]>
Reply To:
JEOL-Focused Probe Users List <[log in to unmask]>
Date:
Fri, 25 Jan 2019 08:26:23 -0600
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Dear colleagues,

We would like to remind you of the forthcoming M&M 2019 Symposium P10:
Applications of electron microscopy and microanalysis in characterizing
natural and synthetic materials. The deadline for submitting a 2-page paper
is Friday, February 15, 2019.

Thank you,
Donggao Zhao


---------- Forwarded message ---------
From: Zhao, Donggao <[log in to unmask]>
Date: Wed, Jan 23, 2019 at 1:19 PM
Subject: [MSA-talk] Microscopy & Microanalysis 2019 Symposium P10:
Applications of electron microscopy and microanalysis in characterizing
natural and synthetic materials
To: [log in to unmask] <[log in to unmask]>


Dear colleagues,



We would like to draw your attention to the following M&M 2019 session,
August 4-8, 2019, Portland, Oregon: The submission portal is open! Submit
your 2-page paper as soon as possible at
https://www.microscopy.org/MandM/2019/. The deadline is Friday, February
15.



M&M 2019 Symposium P10: Applications of integrated electron probe
microscopy and microanalysis techniques in characterizing natural and
synthetic materials



Description: Electron microbeam techniques, such as SEM/ESEM, EPMA and
TEM/STEM, use a focused electron probe or a small parallel electron beam to
bombard a specimen and generate signals at a scale from micrometer down to
Angstrom level. These signals include secondary electron (SE),
backscattered electron (BSE), characteristic X-ray, cathodoluminescence
(CL), transmitted electron, diffracted or scattered electron, etc.
Information acquired using these signals includes image, chemistry and
crystal structure of a specimen at micrometer, nanometer and sub-Angstrom
levels.



We welcome contributions covering the entire range of electron probe
microscopy and microanalysis of natural and synthetic materials, such as:

• Imaging from SE, BSE, X-ray, CL, charge contrast, transmitted electron,
diffracted or scattered electron, etc.

• Qualitative and quantitative determination of chemistry of natural and
synthetic materials

• Repeatability, reproducibility and compatibility of quantitative
microanalysis standards

• Crystal structure determination using electron diffraction or electron
backscattered diffraction (EBSD)



Feel free to share this information to other potentially interested
colleagues. We are very much looking forward to seeing you in Portland,
Oregon!



Best Regards,



Organizers:



Donggao Zhao

Email: [log in to unmask]

Affiliation: University of Missouri-Kansas City

Phone 1: 816-235-2072 (W)

Phone 2: 803-732-6280 (M)



Minghua Ren

Email: [log in to unmask]

Affiliation: University of Nevada, Las Vegas

Phone 1: 702-774-1465 (W)

Phone 2: 915-217-4392 (M)



Owen Neill

Email: [log in to unmask]

Affiliation: University of Michigan

Phone 1: 734-615-6657 (W)

Phone 2: (207) 653-6331 (M)
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