September 2008


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John Fournelle <[log in to unmask]>
Reply To:
JEOL-Focused Probe Users List <[log in to unmask]>
Tue, 2 Sep 2008 15:00:22 -0500
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X-Resent-From: "Microscopy Listserver" <[log in to unmask]>
Subject: [Microscopy] Electron Microscopy Session at AGU Fall Meeting
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Dear Colleagues:

The 2008 Fall Meeting of the American Geophysical Union (San Francisco,
Dec. 15-19, will include a session
entitled   "Atmospheric Aerosols and Electron Microscopy".

Session A20 invites studies of an understanding of atmospheric aerosols
through the use of electron microscopy and x-ray microanalysis. Studies include
but are not limited to microscopic determinations of particle size, morphology,
and chemical composition to reveal sources of anthropogenic aerosols vs.
natural aerosols and to reveal links between climatic effects of aerosols and
the physical and chemical properties of individual particles.

       Key Words
       0305 Aerosols and Particles
       0345 Pollution: Urban and Regional
       0394 Instruments and Techniques
       1029 Composition of Aerosols and Dust Particles (Geochemistry)
       0365 Troposphere: Composition and Chemistry

Abstracts are due without exception by September 10 and acceptances sent
Oct. 23-24. Please go to
for instructions on submitting an abstract. If you wish to submit an
abstract and are not a member of AGU, please email Joe or myself. And 
please forward
this email to any interested colleagues.

I hope we'll see you in San Francisco!

Robert Willis, Ph.D.
US Environmental Protection Agency
National Exposure Research Laboratory!
Environmental Characterization and Apportionment Branch
MD E205-03
Research Triangle Park, NC 27711
Tel: 919-541-2809  Fax: 919-541-0960
[log in to unmask]

Joseph M. Conny, Ph.D.:
Surface and Microanalysis Science Division
National Institute of Standards and Technology
100 Bureau Drive Stop 8372
Gaithersburg, MD 20899-8372
fax 301-926-6689
email [log in to unmask]