### Apologies for cross-posting ###
We would like to remind you of the forthcoming Pre-Meeting Congress at the Microscopy & Microanalysis meeting in Baltimore, MD (USA):
Get $50 discount by registering on or before June 25th! You do NOT need to be a FIGMAS member to register for this PMC. This Pre-Meeting Congress will consist of the following three topics and their respective invited
PART 1 - Standard-based and standardless best practices
Nicholas Ritchie (NIST)
Philippe Pinard (Oxford Instruments)
Steve Seddio (Thermo Scientific)
PART 2 - Standard maintenance and availability
Cathy Johnson (Mager Scientific)
Tim Rose (Smithsonian Institution - National Museum for Natural History)
Gene Rodek (SPI)
PART 3 - Sourcing and creating future standard materials
Steve Wilson (USGS)
William Nachlas (Syracuse University)
Many thanks to our sponsors!
- JEOL USA, Inc.
- International Association of Geoanalysts Ltd
- Structure Probe, Inc. (SPI Supplies)
- Oxford Instruments, plc.
- Probe Software, Inc.
Looking forward to seeing you in Baltimore!
JEOL Probe Users Listserver
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Anette von der Handt (leader-elect)
Owen K. Neill (secretary-treasurer)
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Electron Microprobe Lab, University of Minnesota
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