SCANNING PROBE MICROSCOPY: PRINCIPLES AND PRACTICE.
In-situ observation of surfaces at the micro- and nano-level.

18-22 January 1999

Short Course from the School of Mechanical and Materials Engineering,
University of Surrey, Guildford, UK.

Everything You Always Wanted to Know about STM, SFM
and other methods of the Scanning Probe Microscopy...

Today Scanning Tunnelling Microscopy (STM), Scanning Force Microscopy (SFM)
and other
methods of Scanning Probe Microscopy (SPM) are some of the most powerful
and revolutionary
approaches to studying the structures and properties of materials in
chemistry,
physics, biology, geology, and materials science and they are also
beginning to be used
as a quality control tool in industry. Without the need for special sample
preparation,
SPM can be used for spectacular 3-D imaging and investigation of virtually
any material
at the nanoscopic and atomic level not only in vacuum, but also in ambient
laboratory
conditions and under liquids. Many other applications of SPM, yielding
surface nanoscale
information such as: friction coefficients, temperature distribution within
a scan area,
electrochemical properties, magnetic structure, electrical potential,
adhesion/compliance
have emerged recently. Since SPM instruments are relatively inexpensive
table-top
instruments they ar ideally suited for numerous applications.

In the SPM the vertical (Z) and horizontal (X,Y) ranges can be selcted
independently
to best present the surface structure. Using "dual magnification" the SPM
combines
the wide field view of Scanning Electron Microscope (SEM) with vertical
resolution
that exceeds that of a Transmission Electron Microscope (TEM). The ratio of
the
vertical to horizontal magnification can be very large (1000 or more) to
allow easy
perception of differences between very smooth surfaces.

SPM has demonstrated tremendous potential in materials science, biology and
nanotechnology
and is particularly good for high-technology research. SPM will most likely
be
responsible for the next generations of faster computers, smaller lasers,
and higher
resolution displays as well as many other new products coming to market.
The semiconductor
industry, biotechnology, surface science and many other fields are already
moving
beyond the boundaries of optical and SEM resolution, making the SPM the
dominant
nano-research tool.


THE COURSE

The aim of this five day intensive course is to introduce the principles
and practice of Scanning Tunnelling Microscopy (STM), Scanning Force
Microscopy (SFM)
and other methods of Scanning Probe Microscopy (SPM).

The physical concepts employed in the instrumentation of STM and SFM are
simple, but the
interpretation of the STM and SFM results can be complicated because of the
convolution of
several interactions in the measurement process.  This complication exists
in the large scale
imaging of surface morphology as well as in the molecular- and atomic scale
images. Thus,
many STM and SFM studies can be misinterpreted. To help to alleviate this
problem, we felt
it necessary to bring together in this course the essential components of
STM and SFM
studies, namely, the practical aspects of STM and SFM, the image simulation
and the
qualitative evaluations of tip force induced surface corrugations.

The primary goal of the course will be to describe how the surfaces
of various materials are characterised by employing STM, SFM and other
methods of SPM and what physical/chemical features can be deducted from
their images.

This will be achieved through a balance of lectures, tutorials and laboratory
demonstrations. The course will provide a theoretical introduction to the
field and an overview of recent development. Lectures given by leading
SPM experts will be supported by supervised exercise classes in which
experience will be
gained in the solution of typical problems in SPM.

The Course will cover the basics of operation and advanced operation.
Course registrants will have access to two STM and SFM microscopes in the
Surface and Interface Reaction Group and much of the subject matter will
be demonstrated on these instruments.

WHO SHOULD ATTEND

The course will be of maximum benefit to you if you are, or expect to
be involved in using any form of Scanning Probe Microscopy as a research,
diagnostic or trouble-shooting tool. Engineers, Chemists and Physicists
who are using Confocal Microscopy, Scanning Electron Microscopy and
Transmission
Electron Microscopy will also find the course extremely useful.

COURSE FORMAT

The course will commence with registration at 9:30 on Monday 18 January
1999 and continue until 15:00 on Friday 22 January. The program of lectures
is well distributed with a variety of tutorials each day. There will be
plenty of opportunities for discussion with lecturers and other delegates.
Full course notes will be supplied to all participants.

ORGANISERS AND PRINCIPAL LECTURERS:

Professor Jim Castle (SMME, University of Surrey)
Dr. Peter Zhdan (SMME, University of Surrey)

INVITED LECTURERS INCLUDE:

Professor Michael Bowker (University of Reading)
Professor Martyn Davies (University of Nottingham)
Professor Trevor Page (University of Newcastle)
Professor John Pethica (University of Oxford)
Professor Richard Palmer (University of Birmingham)

For further information contact Dr. Peter Zhdan ([log in to unmask])
or the Course Secretary:

Mrs. Margaret Morgan
School of Mechanical and Materials Engineering University of Surrey
Guildford, Surrey GU2 5XH
UK

Tel: Guildford: (01483) 259378; Fax: (01483) 259508


SOME OF THE SPM APPLICATIONS:

Adhesion,
Adsorption
Biological molecules and bioengineering
Biomaterials
Ceramics
Coatings
Composite materials
Contact lenses
Corrosion and Passivation
Crack initiation/propagation
Crystal structures
Diamond Films
Drugs
Electrochemistry and Electrode Processes
Electrodeposition and electroplating
Electropolishing and electrofinishing
Fabrication technologies
Fibres and fibrous materials (hair)
Friction and wear
Fuel cell technology
Gas-phase and liquid-phase catalysis
Glasses and glazes
Gratings
Hydration processes
Inhibitors
Integrated circuits
Langmuir-Blodgett films
Lithography
Liquid crystals
"Living" biological specimens
Magnetic media
Materials Science and Engineering
Membranes
Nanotechnology
Nucleation and growth processes
Polishing and machining
Polymers
Powder materials
Quality control
Roughness measurements
Sensors
Superconductivity
Surface modification and engineering
Tribology
Zeolites