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The Center for Materials Science and Engineering

And

Olympus Industrial America

Presents

LEXT Confocal Technology for Metrology Applications

Monday June 25
10:00-11:00 Seminar in the Von Hippel Room 13-2137

Monday June 25-Thursday June 28
Demonstration in 13-4149
Email [log in to unmask] to reserve one hour block of time

Laser confocal microscopy is a well-established technique for biological 
applications.  However, it is not widely used by Materials Scientists. The 
Olympus LEXT system takes advantage of confocal techniques to perform 3 
dimensional data acquisition.  The instrument performs measurements of 
surface roughness, step heights, and curvature of beam bending, and 
visualizes high resolution surface features.  Images can be taken up to 
14,400x magnification.  The lateral resolution is 120 nm and the Z 
resolution is 10 nm.

Since the tool utilizes optical methods to obtain high resolution, the 
analysis is non-destructive.  Furthermore, little sample preparation time 
is needed, and the speed and ease of use help shorten the amount of time 
needed to obtain data.

Please attend this seminar, where we discuss the technology and the 
applications of confocal microscopy to materials analysis and 
characterization.  Please contact Jimmy Jia (
[log in to unmask]) to register and reserve time to analyze 
your own samples.

http://events.mit.edu/event.html?id=7837468&date=2007/06/15


Jimmy Jia
Territory Manager
Olympus Industrial America

[log in to unmask]
Cell: 617-335-0073
Customer Service: 866-642-4725
Fax: 800-233-0697






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